The invention allows for the physical/mechanical, and chemical, nanoscale features of various material samples to be measured. The invention provides nanoscale surface as well as subsurface information. With high resolution, the subsurface material such as embedded nanoparticles or other material inhomogeneities can be resolved with a resolution comparable to other existing atomic force microscopy-based approaches.
ID: ID 2253License Status
ID 2253: Mode-synthesizing Atomic Force Microscopy (MSAFM) and Mode-Synthesizing Sensing (MSS)